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Current state of the art in feature sizes is 20 nm metal pitch / 45 nm gate pitch.


We both know that feature sizes became marketing names over a decade ago. The "12 nm" for that fab are of course the marketing name. In any case, it's a seriously old process at this point.


Directionally correct, but rather: the process moniker became disconnected from the feature size.


I think it's still /somewhat/ close to feature size - I think the fin pitch of the "N3" tsmc process was about 5nm, which gives a "minimum feature size" of ~2.5nm to ensure the "gap" between them.

I think one of the big differences is that the "Gate Contact Area" simply isn't the smallest "feature" anymore - but the ITRS that defined those names called it "feature size", not "gate size" from the beginning intentionally.

You probably could make a transitor with a gate size of a similar order to the "feature size", it'll just perform awfully to be completely useless.




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